Bruce A. Crawford

Accent Optical Technologies supllies process control tools for optoelectronic, wireless and silicon semiconductor manufacturers worldwide. Its portfolio of products include: Critical Dimension and Scatterometry, Defect Detection, Pulsed Current Analysis, DLTS, Electrochemical CV Profiling, FT-IR, Hall Mobility System, Overlay, PL Mapping; X-ray Diffraction and Contamination Mapping. It was founded in July, 2000 and is headquartered in Bend, OR

Nanometrics, Inc. engages in the production of process control metrology and inspection systems used in the fabrication of semiconductors and other solid-state devices. The firm operates through the following geographical segments: South Korea; China; Singapore; United States; Taiwan; Japan; and Others. Its products and solutions include semiconductor; data storage; advanced packaging; HB-LED; solar photovoltaic; and product upgrades. The company was founded by Vincent J. Coates in 1975 and is headquartered in Milpitas, CA.