Steven Danyluk
Corporate Officer/Principal en Georgia Institute of Technology .
Perfil
Steven Danyluk was the founder of Qcept Technologies, Inc. founded in 2002 where he held the title of Director.
Currently, he is the Director-Manufacturing Research Center at Georgia Institute of Technology.
Previously, he held the position of Director-Manufacturing Research Center at the University of Illinois and Staff Member at Texas Instruments Incorporated.
Dr. Danyluk holds a doctorate degree from Cornell University and an undergraduate degree from the University of Delaware.
Cargos activos de Steven Danyluk
Empresas | Cargo | Inicio |
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Georgia Institute of Technology | Corporate Officer/Principal | - |
Antiguos cargos conocidos de Steven Danyluk.
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TEXAS INSTRUMENTS INCORPORATED | Corporate Officer/Principal | - |
University of Illinois | Corporate Officer/Principal | - |
Qcept Technologies, Inc.
Qcept Technologies, Inc. SemiconductorsElectronic Technology Qcept Technologies, Inc. provides wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Its ChemetriQ platform is adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. The company was founded by Steven Danyluk and Morris M. Bryan in 2002 and is headquartered in Atlanta, GA. | Fundador | - |
Formación de Steven Danyluk.
University of Delaware | Undergraduate Degree |
Cornell University | Doctorate Degree |
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Empresas cotizadas | 1 |
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TEXAS INSTRUMENTS INCORPORATED | Electronic Technology |
Empresas privadas | 1 |
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Qcept Technologies, Inc.
Qcept Technologies, Inc. SemiconductorsElectronic Technology Qcept Technologies, Inc. provides wafer inspection solutions for non-visual defect (NVD) detection in advanced semiconductor manufacturing. Its ChemetriQ platform is adopted in critical processes for inline, non-contact, full-wafer detection of such NVDs as sub-monolayer organic and metallic residues, process-induced charging, and other undesired surface non-uniformities that cannot be detected by conventional optical inspection equipment. The company was founded by Steven Danyluk and Morris M. Bryan in 2002 and is headquartered in Atlanta, GA. | Electronic Technology |
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